National Instruments introduces industry’s highest throughput PXI Frame Grabber

By admin July 21, 2011 12:27 pm

National Instruments introduces the NI PXIe-1435 high-performance Camera Link frame grabber. Engineers can use the new module to integrate high-speed and high-resolution imaging into their PXI systems, the industry standard for automated test with more than 1,500 measurement modules available from more than 70 vendors. By combining high-throughput imaging with the benefits of off-the-shelf PXI measurement hardware, NI now offers full software-defined solutions for demanding automated test applications in industries such as consumer electronics, automotive and semiconductor.The NI PXIe-1435 is the industry’s highest throughput PXI frame grabber and acquires from all Camera Link camera configurations, including 10-tap extended-full, with up to 850 MB/s of throughput. Engineers can power cameras through Power over Camera Link (PoCL)-enabled cables, eliminating the need for additional wires in deployment environments. The frame grabber also offers 512 MB of DDR2 onboard acquisition memory for added reliability in transferring large images without fear of data overflow. Onboard digital I/O includes four bidirectional transistor-transistor logic (TTL), two opto-isolated inputs and one quadrature encoder for triggering and communicating inspection results with automation devices.The frame grabber incorporates the synchronisation, timing, data streaming and processing capabilities of the PXI Express specification, and supports image processing on complementary field-programmable gate array (FPGA) boards to further boost system performance.The high throughput and low latency of the Camera Link standard make the frame grabber ideal for line-scan image sensors, which engineers can use for surface inspection of large areas, including finding esthetic and functional defects in solar panels and dead pixels in flat panel displays. The NI PXIe-1435 frame grabber also works well in many industrial applications, such as fault analysis using a stop trigger to record images before and after an event on the factory floor, and medical device applications such as analysing intricacies in movement and recording stimulus response in objects from heart valves to eye corneas. l